Evaluating image resolution in stimulated emission depletion microscopy
نویسندگان
چکیده
منابع مشابه
Defining the Noise-limited-resolution for Stimulated Emission Depletion Microscopy
With recent developments in microscopy, such as stimulated emission deletion (STED) microscopy, far-field imaging at resolutions better than the diffraction limit is now a commercially available technique. Here, we analyse how the interplay between shot noise, thermal noise, the saturation intensity of a fluorescent label, and the damage threshold of the sample changes the maximum resolution of...
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ژورنال
عنوان ژورنال: Optica
سال: 2018
ISSN: 2334-2536
DOI: 10.1364/optica.5.000032